| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a nonvolatile semiconductor storage device capable of reducing cumulative time for bit scan. <P>SOLUTION: The nonvolatile semiconductor storage device has a system for detecting an error in terms of bytes and the system for detecting the error in terms of bits and has a pseudo pass function in a chosen block among a plurality of the blocks. When the error in terms of the bytes is detected, the pseudo pass function returns the pass as a state when the number of the errors in terms of the bytes is in allowable range. When the above error in terms of the bits is detected, the pass is returned as the state when the number of the errors in terms of the bits is in the allowable range. After performing writing data or erasing the data to the chosen block, detection of the error in terms of the bytes is executed using the pseudo pass function, and thereafter the detection of the error in terms of the bits is executed using the pseudo pass function. <P>COPYRIGHT: (C)2007,JPO&INPIT |
