发明名称 PHOTOMASK AND PATTERN FORMATION METHOD USING THE SAME
摘要 A photomask includes a transparent substrate having a transparent property against exposing light and a halftone portion formed on the transparent substrate. In the halftone portion, a first opening having a first dimension and a second opening having a second dimension larger than the first dimension are formed. A light-shielding portion is formed on the transparent substrate to be disposed around the second opening.
申请公布号 US2009061328(A1) 申请公布日期 2009.03.05
申请号 US20080181650 申请日期 2008.07.29
申请人 NONAMI YUJI;MISAKA AKIO;IRIE SHIGEO 发明人 NONAMI YUJI;MISAKA AKIO;IRIE SHIGEO
分类号 G03F1/32;G03F1/68;G03F7/22 主分类号 G03F1/32
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