发明名称 CONTACT STRUCTURES AND METHODS OF FORMING THE SAME
摘要 Embodiments of the present disclosure include contact structures and methods for forming the same. An embodiment relates to a method for forming a semiconductor device. The method comprises the following steps of: forming a contact region on a substrate; forming a dielectric layer on the contact region and the substrate; and forming an opening which penetrates the dielectric layer to expose a portion of the contact region. The method further comprises the following steps of: forming a metal-silicide layer on an exposed portion of the contact region along sidewalls of the opening; and filling the opening with a conductive material to form a conductive plug in the dielectric layer wherein the conductive plug is electrically coupled to the contact region.
申请公布号 KR20160003539(A) 申请公布日期 2016.01.11
申请号 KR20140183276 申请日期 2014.12.18
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 LIN YU HUNG;LIN SHENG HSUAN;CHANG CHIH WEI;CHOU YOU HUA;HSU CHIA LIN
分类号 H01L21/3205;H01L21/28 主分类号 H01L21/3205
代理机构 代理人
主权项
地址