发明名称 |
CONTACT STRUCTURES AND METHODS OF FORMING THE SAME |
摘要 |
Embodiments of the present disclosure include contact structures and methods for forming the same. An embodiment relates to a method for forming a semiconductor device. The method comprises the following steps of: forming a contact region on a substrate; forming a dielectric layer on the contact region and the substrate; and forming an opening which penetrates the dielectric layer to expose a portion of the contact region. The method further comprises the following steps of: forming a metal-silicide layer on an exposed portion of the contact region along sidewalls of the opening; and filling the opening with a conductive material to form a conductive plug in the dielectric layer wherein the conductive plug is electrically coupled to the contact region. |
申请公布号 |
KR20160003539(A) |
申请公布日期 |
2016.01.11 |
申请号 |
KR20140183276 |
申请日期 |
2014.12.18 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
发明人 |
LIN YU HUNG;LIN SHENG HSUAN;CHANG CHIH WEI;CHOU YOU HUA;HSU CHIA LIN |
分类号 |
H01L21/3205;H01L21/28 |
主分类号 |
H01L21/3205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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