| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method of checking the quality of built-in software for an IC tester without reducing the operating ratio of the IC tester. <P>SOLUTION: Parameters required for operating the IC tester are sequentially set up to a register in a test header using the normal built-in software using the built-in software built in a pin electronics 1 of the test head 12 according to a test program 30 created by a user, and a parameter management system 34 saves the normal parameters as reference parameters 44. After updating the built-in software, by re-executing the test program 30, the parameters set up using the built-in software being subject to newly debugging are set up to the register and compared with the reference parameters 44 saved in the past. If there is a difference as a result of comparison, it can be determined that the updated built-in software has been degraded. <P>COPYRIGHT: (C)2008,JPO&INPIT |
