发明名称 |
VAPOR DEPOSITION OF METAL OXIDES, SILICATES AND PHOSPHATES, AND SILICON DIOXIDE |
摘要 |
Metal silicates or phosphates are deposited on a heated substrate by the reaction of vapors of alkoxysilanols or alkylphosphates along with reactive metal amides, alkyls or alkoxides. For example, vapors of tris(tert-butoxy)silanol react with vapors of tetrakis(ethylmethylamido) hafnium to deposit hafnium silicate on surfaces heated to 300° C. The product film has a very uniform stoichiometry throughout the reactor. Similarly, vapors of diisopropylphosphate react with vapors of lithium bis(ethyldimethylsilyl)amide to deposit lithium phosphate films on substrates heated to 250° C. Supplying the vapors in alternating pulses produces these same compositions with a very uniform distribution of thickness and excellent step coverage. |
申请公布号 |
US2016268121(A1) |
申请公布日期 |
2016.09.15 |
申请号 |
US201615161903 |
申请日期 |
2016.05.23 |
申请人 |
President and Fellows of Harvard College |
发明人 |
GORDON Roy Gerald;BECKER Jill S.;HAUSMANN Dennis;SUH Seigi |
分类号 |
H01L21/02;H01L29/423;H01L29/51;H01L49/02 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
1. A process for making an insulating metal oxide layer in a microelectronic device, the process comprising:
alternatingly exposing a substrate to a first reactant vapor comprising a metal alkylamide, the metal alkylamide comprising a metal attached to two or more different ligands, at least one of which is an alkylamide, so as to form a deposited metal alkylamide; and a second reactant vapor, so as to form a metal oxide, wherein the deposition of the metal alkylamide and the second reactant are self-limiting, and wherein said metal oxide comprises oxygen and the metal from the metal alkylamide. |
地址 |
Cambridge MA US |