发明名称 VAPOR DEPOSITION OF METAL OXIDES, SILICATES AND PHOSPHATES, AND SILICON DIOXIDE
摘要 Metal silicates or phosphates are deposited on a heated substrate by the reaction of vapors of alkoxysilanols or alkylphosphates along with reactive metal amides, alkyls or alkoxides. For example, vapors of tris(tert-butoxy)silanol react with vapors of tetrakis(ethylmethylamido) hafnium to deposit hafnium silicate on surfaces heated to 300° C. The product film has a very uniform stoichiometry throughout the reactor. Similarly, vapors of diisopropylphosphate react with vapors of lithium bis(ethyldimethylsilyl)amide to deposit lithium phosphate films on substrates heated to 250° C. Supplying the vapors in alternating pulses produces these same compositions with a very uniform distribution of thickness and excellent step coverage.
申请公布号 US2016268121(A1) 申请公布日期 2016.09.15
申请号 US201615161903 申请日期 2016.05.23
申请人 President and Fellows of Harvard College 发明人 GORDON Roy Gerald;BECKER Jill S.;HAUSMANN Dennis;SUH Seigi
分类号 H01L21/02;H01L29/423;H01L29/51;H01L49/02 主分类号 H01L21/02
代理机构 代理人
主权项 1. A process for making an insulating metal oxide layer in a microelectronic device, the process comprising: alternatingly exposing a substrate to a first reactant vapor comprising a metal alkylamide, the metal alkylamide comprising a metal attached to two or more different ligands, at least one of which is an alkylamide, so as to form a deposited metal alkylamide; and a second reactant vapor, so as to form a metal oxide, wherein the deposition of the metal alkylamide and the second reactant are self-limiting, and wherein said metal oxide comprises oxygen and the metal from the metal alkylamide.
地址 Cambridge MA US