TEST SUPPORT METHOD OF TEST HANDLER

摘要

A test supporting method of the test handler is provided, which reduces the test time by increasing the operation efficiency of tester to the maximum. A test supporting method of the test handler is as follows. It supports so that the semiconductor devices of the prime lot can be classified according to the quality after the semiconductor devices of the prime are tested(S601). It determines whether the set retest start condition is satisfied or not before the prime lot test supporting step is completed(S602). In the decision step, if it is determined that the retest start condition is satisfied, retest toward the semiconductor devices of retest is supported(S603).