发明名称 Methods of Forming Trench Isolation and Methods of Forming Floating Gate Transistors
摘要 A method of forming trench isolation includes etching first trench lines into semiconductive material of a semiconductor substrate. First isolation material is formed within the first trench lines within the semiconductive material. After forming the first isolation material within the first trench lines, second trench lines are etched into semiconductive material of the substrate between the first trench lines such that the first trench lines and second trench lines alternate. Second isolation material is formed within the second trench lines within the semiconductive material. Alternate and additional aspects are contemplated.
申请公布号 US2009155980(A1) 申请公布日期 2009.06.18
申请号 US20070958551 申请日期 2007.12.18
申请人 HILL CHRISTOPHER W 发明人 HILL CHRISTOPHER W.
分类号 H01L21/76 主分类号 H01L21/76
代理机构 代理人
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