发明名称 Objective lens for focusing charged particles in an electron microscope
摘要 An objective lens which is a component of a scanning electron microscope and wherein the electron source or the intermediate image of the electron source is reduced by condenser lenses is imaged onto a specimen (PR). The objective lens comprises an asymmetrical magnetic lens (ML), an electrostatic immersion lens (OE/UE) superimposed on the magnetic lens (ML), and electrode (ST) which is connected to a variable potential (UST) so as to control the intensity of the current of secondary (SE) and back-scattered electrodes released from the specimen (PR), and a detector (DT) mounted immediately above the magnetic lens (ML). The electrodes (OE, UE) of the immersion lens are connected to potentials so that an electrical field which decelerates the primary electrons (PE) is formed inside the objective lens.
申请公布号 US4926054(A) 申请公布日期 1990.05.15
申请号 US19890318970 申请日期 1989.03.06
申请人 ICT INTEGRATED CIRCUIT TESTING GESELLSCHAFT FUER HALBLEITERPRUEFTECHNIK MBH 发明人 FROSIEN, JUERGEN
分类号 H01J37/12;G01Q30/02;H01J37/141;H01J37/145;H01J37/244;H01J37/28 主分类号 H01J37/12
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