发明名称 ABNORMALITY MONITORING DEVICE
摘要 <p>PURPOSE:To obtain an abnormality monitoring device which can judge abnormality properly even for a process which repeats fluctuation of state at a certain period. CONSTITUTION:A normal allowable range is determined as a time function for one-period fluctuation of a physical quantity which is related to the state of a process. By operating a process device, the physical quantity which actually fluctuates is compared with a previously determined allowable range. When the actual physical quantity reaches outside the allowable range (a shadow part A5, a shadow part B6, a shadow part C7), it is judged that an abnormality has occurred. The allowable range of a normal state can be specified flexibly along time instead of a fixed value. Therefore, even if a process state repeats a large fluctuation periodically, a normal abnormality judgment can be made constantly by comparison with the allowable range.</p>
申请公布号 JPH05273000(A) 申请公布日期 1993.10.22
申请号 JP19920073672 申请日期 1992.03.30
申请人 发明人
分类号 G01D21/00;G05B23/02;(IPC1-7):G01D21/00 主分类号 G01D21/00
代理机构 代理人
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