发明名称 QUANTUM WELL STRUCTURE AND ITS MANUFACTURE
摘要 PURPOSE:To realize a quantum well with a low voltage applied to an electrode and a low consumption power, by using a very thin silicon layer and a very thin oxide film layer of an SOI substrate. CONSTITUTION:A silicon substrate 1, a silicon oxide film layer 2, and a thin film silicon layer 3 are unified in a body to constitute an SOI(silicon on insulator) structure substrate. The silicon oxide film layer 2 is a thin film layer of about 300nm in thickness. The thin film silicon layer 3 is a thin film layer of about 100nm in thickness. A high concentration impurity diffusion region 4, a back gate electrode 5, a control gate 6, and a control gate 15 are formed, thereby obtaining a quantum well structure. A positive voltage is applied to the back gate electrode, and a negative voltage is applied to a control gate electrode 15. Thereby a quantum well structure of one dimensional electron gas 30 of 100-30nm in width can be formed.
申请公布号 JPH06326299(A) 申请公布日期 1994.11.25
申请号 JP19930111336 申请日期 1993.05.13
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 MORIMOTO TADASHI;HIRAI YOSHIHIKO;YUKI KOICHIRO;NIWA MASAAKI;YASUI JURO;OKADA KENJI;UDAGAWA SHOJI
分类号 H01L29/06;H01L29/66;H01L29/68;(IPC1-7):H01L29/68 主分类号 H01L29/06
代理机构 代理人
主权项
地址