发明名称 IMPEDANCE MEASURING DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide an impedance measuring device capable of measuring high impedance for a wide band frequency to be measured. SOLUTION: The influence of an in-phase voltage giving an error to the float type ammeter of an impedance measuring device by a voltage current measuring method is eliminated from a wide frequency band. In other words, in the float type ammeter for measuring the voltages of both ends of a current detection resistor, an in-phase component is eliminated in a high measured frequency band by a balun 35 and, in a low band, an in-phase component is eliminated by a differential amplifier 31. The in-phase eliminating actions of the balun 35 and the differential amplifier 31 cross over each other in a frequency in which the impedance of a capacitor 33 is equal to the excited impedance of the balun 35. In a cross-over frequency, a resistor 37 is selected to lose resonance produced by the excited impedance of the capacitor 33 and the balun 35 and cross-over characteristic is made smooth.</p>
申请公布号 JPH09318671(A) 申请公布日期 1997.12.12
申请号 JP19960136405 申请日期 1996.05.30
申请人 HEWLETT PACKARD JAPAN LTD 发明人 WAKAMATSU HIDEKI
分类号 G01R15/18;G01R19/00;G01R27/02;G01R27/16;(IPC1-7):G01R15/18 主分类号 G01R15/18
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