发明名称 METHOD AND DEVICE FOR DRY ETCHING
摘要 <p>A work is etched by supplying oxygen and carbon to the work such that the ratio of the number of oxygen atoms to the number of carbon atoms become 0.1 or less and controlling the deposition of a protective film and etching. This results in the reduction of side etching in a wiring process and enables a minuter wiring process with high dimension accuracy even if a resist selection rate is increased.</p>
申请公布号 WO1998006126(P1) 申请公布日期 1998.02.12
申请号 JP1996002227 申请日期 1996.08.07
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