| 摘要 |
PROBLEM TO BE SOLVED: To provide a method which can automatically generate a high quality test pattern for a RTL digital circuit quickly. SOLUTION: Producing an assignment decision diagram that represents the RTL digital circuit generates the test pattern. Nonary symbolic algebra is used to determine a target for each part identified within the assignment decision diagram. The target is justified and propagated by traversing the assignment decision diagram for which a test environment is found. When the test environment is not found in advance, a heuristic method is used. By using the test environment that is found out, a predetermined test vector is propagated to acquire a system level test set. The respective test sets for each part are combined to obtain a complete test set for the RTL digital circuit. |
