发明名称 BEAM PROFILE MEASURING DEVICE AND METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To provide a device for measuring the overall intensity and power of a beam by measuring the intensity profile of the beam, with regard to an optical three-dimensional shaping process. SOLUTION: In a sensor for beam profile measurement equipped with a pinhole plate and an optical detector arranged behind the former, a beam spot is transferred and consequently, the sensor for beam profile measurement measures an intensity which is respectively covered by some of different regions inside the beam spot. Software interrelated with the sensor for beam profile measurement controls a beam scan mechanism in a computer to transfer the beam spot onto a pinhole. Further, the software controls the mechanism to make the beam spot traverse over the pinhole and thus the intensity profile of the beam is obtained. A related device and a related method for the calibration and standardization of a three-dimensional shaping device are disclosed. In addition, a related device and a related method for correcting a positional deviation over time in the process of shaping a three-dimensional object are revealed.
申请公布号 JP2002316364(A) 申请公布日期 2002.10.29
申请号 JP20020015983 申请日期 2002.01.24
申请人 THREE D SYST INC 发明人 SPENCE STUART T;TARNOFF HARRY;ALMQUIST THOMAS
分类号 G01B11/24;B29C67/00;G01J1/02;G01J1/42;(IPC1-7):B29C67/00 主分类号 G01B11/24
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