发明名称 |
METHOD FOR FABRICATING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for fabricating a semiconductor device is provided to planarize an interlayer dielectric of a semiconductor substrate by eliminating the necessity of a conventional chemical mechanical polishing(CMP) process, and to simplify a planarization process of the interlayer dielectric by omitting a brush scrubbing process, a deionized water cleaning process and a sulfuric acid peroxide mixture(SPM) cleaning process. CONSTITUTION: A metal interconnection(20) is formed on the semiconductor substrate(10). An interlayer dielectric(30) of a multilayer structure is formed on the semiconductor substrate. Etchant(48) is injected to the interlayer dielectric through a nozzle while the semiconductor substrate is rotated, so that the interlayer dielectric is planarized.
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申请公布号 |
KR20030053367(A) |
申请公布日期 |
2003.06.28 |
申请号 |
KR20010083547 |
申请日期 |
2001.12.22 |
申请人 |
DONGBU ELECTRONICS CO., LTD. |
发明人 |
SIM, JUN BEOM |
分类号 |
H01L21/304;(IPC1-7):H01L21/304 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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