| 主权项 |
1. An active probe card for improving testing bandwidth of a device under test (DUT), comprising:
a printed circuit board; at least one probe needle, affixed to a first surface of the printed circuit board for probing the DUT; at least one connection member, electrically connected to the at least one probe needle; an amplification circuit, formed on the printed circuit board and coupled to the at least one connection member for amplifying an input signal of the DUT; and at least one affixing unit, for affixing the at least one probe needle to the first surface of the printed circuit board, wherein a material of the affixing unit is a ceramic material or an electrically insulating plastic material; wherein the amplification circuit comprises:
a differential operational amplifier or a single-ended operational amplifier; or a differential comparator or a single-ended comparator; or an equalizer; wherein the equalizer has at least one of a pre-emphasis function and a de-emphasis function, the pre-emphasis function provides a first amplification factor, the de-emphasis function provides a second amplification factor, the first amplification factor is greater than the second amplification factor, and the first amplification factor and the second amplification factor are programmable or fixed values. |
