发明名称 SEMICONDUCTOR DEVICE COMPRISING A SUBSTRATE, AND PRODUCTION METHOD THEREOF
摘要 <p>A semiconductor device is produced through processes that; ionized material is poured into a predetermined depth of a silicon substrate (51) so as to be made into etching stopper layer (52), a predetermined area of the silicon substrate is etched up to the depth of the etching stopper layer so as to form a concave portion (54), a compound semiconductor chip (55) is accommodated in the concave portion, insulating film (56) is formed covering a space between the surrounding wall of the concave portion and the side wall of the compound semiconductor chip so as to be patterned, and that a second thin film circuit (57) is so formed on the patterned insulating film as to connect between the electrodes on the compound semiconductor chip and a first thin film circuit (60) which is previously formed on the surface of the silicon substrate.</p>
申请公布号 EP0288052(A3) 申请公布日期 1989.08.23
申请号 EP19880106396 申请日期 1988.04.21
申请人 SUMITOMO ELECTRIC INDUSTRIES LIMITED 发明人 NISHIGUCHI, MASANORI YOKOHAMA WORKS
分类号 H01L23/522;H01L21/306;H01L21/60;H01L21/768;H01L23/12;H01L23/13;H01L23/14;(IPC1-7):H01L23/12 主分类号 H01L23/522
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