发明名称 |
SEMICONDUCTOR DEVICE COMPRISING A SUBSTRATE, AND PRODUCTION METHOD THEREOF |
摘要 |
<p>A semiconductor device is produced through processes that; ionized material is poured into a predetermined depth of a silicon substrate (51) so as to be made into etching stopper layer (52), a predetermined area of the silicon substrate is etched up to the depth of the etching stopper layer so as to form a concave portion (54), a compound semiconductor chip (55) is accommodated in the concave portion, insulating film (56) is formed covering a space between the surrounding wall of the concave portion and the side wall of the compound semiconductor chip so as to be patterned, and that a second thin film circuit (57) is so formed on the patterned insulating film as to connect between the electrodes on the compound semiconductor chip and a first thin film circuit (60) which is previously formed on the surface of the silicon substrate.</p> |
申请公布号 |
EP0288052(A3) |
申请公布日期 |
1989.08.23 |
申请号 |
EP19880106396 |
申请日期 |
1988.04.21 |
申请人 |
SUMITOMO ELECTRIC INDUSTRIES LIMITED |
发明人 |
NISHIGUCHI, MASANORI YOKOHAMA WORKS |
分类号 |
H01L23/522;H01L21/306;H01L21/60;H01L21/768;H01L23/12;H01L23/13;H01L23/14;(IPC1-7):H01L23/12 |
主分类号 |
H01L23/522 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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