发明名称 PHASE SHIFT MASK FABRICATION
摘要 A light-transmitted region(A) and a light-non-transmitted region(B) are set by getting photoresist film(2) to be patterned with an electron beam. An etching groove is formed by anisotropic etching of the light-transmitted region. After the first photoresist film is removed, a second photoresist film(4) is spreaded on an upper part of the quartz substrate. Then, the second photoresist film is etched, a baked photoresist film(4A) being formed by a baked process. After that, a third photoresist film(5) is spreaded on an upper part of a whole structure and a patterned third photoresist film(5A) being formed which is patterned by development of exposure part of the third photoresist film. Cr(6) is deposited on a surface of the quartz substrate exposed to the light-non-transmitted region and a surface of the baked photoresist film exposed to the light-transmitted region.
申请公布号 KR970011645(B1) 申请公布日期 1997.07.12
申请号 KR19940004783 申请日期 1994.03.11
申请人 HYUNDAI ELECTRONICS IND. CO.,LTD 发明人 HAM, YOUNG-MOK
分类号 H01L21/027;(IPC1-7):H01L21/027 主分类号 H01L21/027
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