发明名称 METHOD OF POSITIONING WAFER ORIENTATION FLAT, WAFER CHUCK, AND SEMICONDUCTOR MANUFACTURING/TESTING APPARATUS
摘要 <p>PROBLEM TO BE SOLVED: To accurately position the orientation flat by pressing a wafer to a positioning mechanism attached to a wafer chuck. SOLUTION: At positioning of the orientation flat 20a by pressing a wafer 20 to a positioning mechanism 32 attached to a wafer chuck 30, a mounting face 38 is inclined enough to move the wafer 20 to the positioning mechanism 32 due to its self wt., thus positioning its orientation flat 20a.</p>
申请公布号 JPH1022368(A) 申请公布日期 1998.01.23
申请号 JP19960173909 申请日期 1996.07.03
申请人 FUJITSU LTD 发明人 OBARA HITOSHI
分类号 G03F7/20;G03F9/00;H01L21/027;H01L21/68;H01L21/683;(IPC1-7):H01L21/68 主分类号 G03F7/20
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