发明名称 |
METHOD OF POSITIONING WAFER ORIENTATION FLAT, WAFER CHUCK, AND SEMICONDUCTOR MANUFACTURING/TESTING APPARATUS |
摘要 |
<p>PROBLEM TO BE SOLVED: To accurately position the orientation flat by pressing a wafer to a positioning mechanism attached to a wafer chuck. SOLUTION: At positioning of the orientation flat 20a by pressing a wafer 20 to a positioning mechanism 32 attached to a wafer chuck 30, a mounting face 38 is inclined enough to move the wafer 20 to the positioning mechanism 32 due to its self wt., thus positioning its orientation flat 20a.</p> |
申请公布号 |
JPH1022368(A) |
申请公布日期 |
1998.01.23 |
申请号 |
JP19960173909 |
申请日期 |
1996.07.03 |
申请人 |
FUJITSU LTD |
发明人 |
OBARA HITOSHI |
分类号 |
G03F7/20;G03F9/00;H01L21/027;H01L21/68;H01L21/683;(IPC1-7):H01L21/68 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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