发明名称 |
APPARATUS FOR DISPLAYING WAFER IMAGE IN SEMICONDUCTOR STEPPER |
摘要 |
PURPOSE: An apparatus for displaying a wafer image in a semiconductor stepper is provided to ease an arrangement of a wafer and to allow an effective maintenance of the stepper. CONSTITUTION: In the display apparatus, the first microscope(10) for detecting the wafer is connected to the first charge coupled device(CCD)(30), and the second microscope(16) for detecting a reticle is connected to the second CCD(32). Both the CCDs providing an excellent image are connected to a controller(34). The controller(34) is further connected to an interface(24) for receiving a signal from a panel(22) and sending the signal to the controller(34). The panel(22) is used for selecting input/output by a human operator. The controller(34) is yet further connected to a monitor(20).
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申请公布号 |
KR20010037040(A) |
申请公布日期 |
2001.05.07 |
申请号 |
KR19990044324 |
申请日期 |
1999.10.13 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KWON, TAE CHEOL;YOO, HUI YONG |
分类号 |
H01L21/027;(IPC1-7):H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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主权项 |
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地址 |
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