发明名称 SENSOR USING TOTAL REFLECTION ATTENUATION
摘要 PROBLEM TO BE SOLVED: To improve the measurement accuracy by reducing an influence caused by the difference of a refraction index between a sample liquid and a reference liquid in a sensor measuring the state change of total reflection attenuation. SOLUTION: The sample liquid 11 and reference liquid 11' are individually supplied to a measurement chip 6 and a reference chip 6' with a sensing material 30 arranged, a light beam 13 is made incident on the chip 6 and the chip 6' at various angles so that total reflection condition is obtained at an interface 10b between a metallic film 12 and a dielectric block 10, and then the light beam 13 totally reflected at the interface 10b is detected with a photodiode array 17. Then the state change of the total reflection attenuation is measured by compensating the measurement result to a measurement unit 1 by using the measurement result of a reference unit 1'. In advance of measurement, adjustment is performed so that the total reflection attenuation angle of the reference liquid 11' detected in a total attenuation angle detecting part 53 by mixing a solvent with high concentration or a PBS into the reference liquid 11' in a mixer 52 equals the total reflection attenuation of the sample liquid 11 detected in a detecting part 43 for the total reflection attenuation angle. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003240707(A) 申请公布日期 2003.08.27
申请号 JP20020036792 申请日期 2002.02.14
申请人 FUJI PHOTO FILM CO LTD 发明人 KIMURA TOSHIHITO
分类号 G01N21/27;(IPC1-7):G01N21/27 主分类号 G01N21/27
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