METHOD FOR INSPECTING LIQUID CRYSTAL DISPLAY DEVICE

摘要

PROBLEM TO BE SOLVED: To prevent degradation in a yield by preventing excessive detection of such a cross shorting which does not act as the cross shorting in actual driving in the inspection to subject a substrate of a matrix liquid crystal display device to detection of the cross shorting.

SOLUTION: In inspecting the cross shorting of the substrate, the voltage to be applied between X-Y signal wiring is regulated to the maximum voltage applied between the X-Y signal wiring in the actual driving and the intensity of the electric field applied to insulating films is restricted to≤1.5 MV/cm, by which the occurrence and excessive detection of the X-Y cross shorting can be suppressed and the degradation in the yield is prevented.

COPYRIGHT: (C)2003,JPO