发明名称 |
Smart pixel layout for CMOS image sensor |
摘要 |
A method and system for preventing white pixel difficulties resulting from undesired current induced in an image sensor having a photodiode and a depletion region therein. The photodiode is isolated in a pixel layout for an image sensor. A depletion region is configured, such that the depletion region is maintained in a defect-free region associated with the pixel layout for the image sensor, thereby reducing white pixel difficulties caused by induced and undesired current. The image sensor is preferably a CMOS image sensor. A depletion region of the photodiode is constantly maintained in a defect-free region during operation of the CMOS image sensor.
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申请公布号 |
US2003218678(A1) |
申请公布日期 |
2003.11.27 |
申请号 |
US20020152469 |
申请日期 |
2002.05.21 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
发明人 |
LIN KUEN-HSIEN;LIU SHANG-HSUAN;CHEN CHIH-HSING;TSAI HUNG JEN;LIU HSIEN-TSONG |
分类号 |
H01L27/146;H04N9/64;(IPC1-7):H04N9/64 |
主分类号 |
H01L27/146 |
代理机构 |
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主权项 |
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