| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor device using a circuit configuration enabling inspection of the current value, voltage value, signals or the like of a signal line. <P>SOLUTION: In the semiconductor device, a second electrode of a TFT is connected to the end of the signal line, then a first electrode is connected to an inspection line. The inspection line is connected to a measuring device which measures the current value, voltage value, signals or the like. Also, to the gate of the TFT, the signal line is connected via another TFT and, in addition, a capacitive element is connected. Here, voltage to turn on the TFT is charged to the capacitive element corresponding to the signal line to be inspected. Also, voltage to turn off the TFT is charged to the capacitive element corresponding to the signal line not to be inspected. These charges are carried out by the signal line. Thus, only the desired signal line is selected and connected to the measuring device. <P>COPYRIGHT: (C)2004,JPO&NCIPI |
