发明名称 |
METHOD FOR FORMING MULTI-LAYER WIRING OF SEMICONDUCTOR DEVICE TO SIMPLIFY FABRICATION PROCESS BY SIMULTANEOUSLY FORMING PLUG AND WIRING |
摘要 |
PURPOSE: A method for forming a multi-layer wiring of a semiconductor device is provided to simplify a fabrication process by using copper to form simultaneously a plug and a wiring. CONSTITUTION: An insulating layer(20) is deposited on a semiconductor substrate(10). A first adhesion layer(40) is deposited into a contact hole. The contact hole is buried by copper. A copper wiring layer(50) is deposited on the first adhesion layer. A photoresist layer is laminated on the copper wiring layer corresponding to a position of the contact hole. A cross-shaped projected plug is formed on the copper wiring layer. The photoresist layer is removed therefrom. A second adhesion layer(70) is deposited on the copper wiring layer. The copper wiring layer is patterned. A nitride layer(90) is deposited on the entire surface of the second adhesion layer. An insulating layer(100) is formed on thereon. The insulating layer is planarized by using a CMP method.
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申请公布号 |
KR100444770(B1) |
申请公布日期 |
2004.08.07 |
申请号 |
KR19970077342 |
申请日期 |
1997.12.29 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KO, HO SUN;LIM, JAE YEONG |
分类号 |
H01L21/768;(IPC1-7):H01L21/768 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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