| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an optical characteristics measuring method capable of easily measuring the optical characteristics of a light scattering and reflecting substrate, and to provide the light scattering and reflecting substrate measured by the same. <P>SOLUTION: A light scattering and reflecting substrate 110 is provided with a glass substrate 111 having a front surface and a back surface, and a scattering film 112 and a reflecting film 113 sequentially layered on the front surface of the glass substrate 111. The optical characteristics of the light scattering and reflecting substrate 110 are measured on the basis of reflected light of measuring light irradiated to the back surface of the glass substrate 111 at a prescribed angle. <P>COPYRIGHT: (C)2005,JPO&NCIPI |
