| 摘要 |
An apparatus and method are disclosed for detecting electromagnetic (EM) energy. An exemplary apparatus includes a dielectric layer for receiving incident EM energy, a metal film and a circuit. The metal film has a first surface adjacent to the dielectric layer and has a thickness selected to stimulate surface plasma polaritons on a second surface of the metal film for electromagnetic energy having a given electromagnetic wavelength incident on the dielectric layer. The circuit determines an incident angle of the incident electromagnetic energy on the dielectric based on the EM energy from the stimulated surface plasmon polaritons. The azimuth and elevation of the incident EM energy can also be determined.
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