发明名称 Method of fabricating semiconductor light emitting device
摘要 A method of fabricating a semiconductor light emitting device includes forming a first conductivity type semiconductor layer, forming an active layer by alternately forming a plurality of quantum well layers and a plurality of quantum barrier layers on the first conductivity type semiconductor layer, and forming a second conductivity type semiconductor layer on the active layer. The plurality of quantum barrier layers include at least one first quantum barrier layer adjacent to the first conductivity type semiconductor layer and at least one second quantum barrier layer adjacent to the second conductivity type semiconductor layer. The forming of the active layer includes allowing the at least one first quantum barrier layer to be grown at a first temperature and allowing the at least one second quantum barrier layer to be grown at a second temperature lower than the first temperature.
申请公布号 US9502605(B2) 申请公布日期 2016.11.22
申请号 US201514714223 申请日期 2015.05.15
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 Han Sang Heon;Lee Dong Yul;Kim Seung Hyun;Kim Jang Mi;Yoon Suk Ho;Lee Sang Jun
分类号 H01L33/00;H01L33/06 主分类号 H01L33/00
代理机构 Muir Patent Law, PLLC 代理人 Muir Patent Law, PLLC
主权项 1. A method of fabricating a semiconductor light emitting device, comprising: forming a first conductivity type nitride semiconductor layer; forming an active layer on the first conductivity type nitride semiconductor layer; and forming a second conductivity type nitride semiconductor layer on the active layer, wherein the active layer has a structure in which a plurality of quantum barrier layers and a plurality of quantum well layers containing indium are alternately stacked, the plurality of quantum barrier layers and the plurality of quantum well layers are divided into a plurality of groups according to a growth direction, and the plurality of groups respectively have at least one quantum barrier layer and at least one quantum well layer and include a first group adjacent to the first conductivity type nitride semiconductor layer and a second group adjacent to the second conductivity type nitride semiconductor layer, and a quantum barrier layer of the first group is grown at a temperature higher than a growth temperature of a quantum barrier layer of the second group, a quantum well layer of the first group having an indium composition ratio lower than that of a quantum well layer of the second group.
地址 Yeongtong-gu, Suwon-si, Gyeonggi-do KR