发明名称 System on chip and temperature control method thereof
摘要 A temperature control method of a semiconductor device is provided. The temperature control method includes detecting a temperature of the semiconductor device; activating a reverse body biasing operation in which a body bias voltage applied to a function block of the semiconductor device is regulated, when the detected temperature is greater than a first temperature level; and activating a thermal throttling operation in which at least one of a frequency of a driving clock provided to a function block of the semiconductor device and a driving voltage applied to the function block of the semiconductor device is regulated, when the detected temperature is greater than a second temperature level that is different than the first temperature level.
申请公布号 US9459680(B2) 申请公布日期 2016.10.04
申请号 US201313948691 申请日期 2013.07.23
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 Kim Hyungock;Kim Wook;Seomun Jun;Oh Chungki;Jeon JaeHan;Do Kyungtae;Choi JungYun;Won Hyosig;Kim Kee Sup
分类号 G06F1/32;G05D23/19;G06F1/20 主分类号 G06F1/32
代理机构 Sughrue Mion, PLLC 代理人 Sughrue Mion, PLLC
主权项 1. A method of controlling a temperature of a semiconductor device, comprising: detecting, by a temperature sensor, a temperature of the semiconductor device; activating a reverse body biasing operation in which, in response to determining that the detected temperature is greater than a first temperature level, a body bias voltage applied to a substrate of a function block of the semiconductor device is regulated; and activating a thermal throttling operation in which, in response to determining that the detected temperature is greater than a second level that is different than the first temperature level, at least one frequency of a driving clock is provided to the function block of the semiconductor device and a driving voltage applied to the function block of the semiconductor device is regulated.
地址 Suwon-si KR