发明名称 |
Improved method of patterning a submicron semiconductor layer. |
摘要 |
<p>A method is provided for patterning a submicron semiconductor layer of an integrated circuit, and an integrated circuit formed according to the same. An interlevel dielectric layer is formed over the surface of the integrated circuit. A substantially planarizing layer is formed over the interlevel dielectric layer. A photoresist layer is formed and patterned over the planarizing layer. The planarizing layer is etched to form openings exposing selected portions of the interlevel dielectric layer, wherein each opening has substantially the same lateral dimensions. The photoresist and planarizing layers are then removed. The interlevel dielectric layer is etched in the openings to expose portions of the underlying integrated circuit. <IMAGE></p> |
申请公布号 |
EP0559323(A2) |
申请公布日期 |
1993.09.08 |
申请号 |
EP19930300698 |
申请日期 |
1993.01.29 |
申请人 |
SGS-THOMSON MICROELECTRONICS, INC. |
发明人 |
NGUYEN, LOI NGOC |
分类号 |
H01L21/302;G03F7/09;H01L21/027;H01L21/3065;H01L21/768;H01L23/522 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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