发明名称 Method and apparatus for measuring surface movement of an object using a polarizing interfeometer
摘要 A system for non-destructively measuring an object and controlling industrial processes in response to the measurement is disclosed in which an impulse laser generates a plurality of sound waves over timed increments in an object. A polarizing interferometer is used to measure surface movement of the object caused by the sound waves and sensed by phase shifts in the signal beam. A photon multiplier senses the phase shift and develops an electrical signal. A signal conditioning arrangement modifies the electrical signals to generate an average signal correlated to the sound waves which in turn is correlated to a physical or metallurgical property of the object, such as temperature, which property may then be used to control the process. External, random vibrations of the workpiece are utilized to develop discernible signals which can be sensed in the interferometer by only one photon multiplier. In addition the interferometer includes an arrangement for optimizing its sensitivity so that movement attributed to various waves can be detected in opaque objects. The interferometer also includes a mechanism for sensing objects with rough surfaces which produce speckle light patterns. Finally the interferometer per se, with the addition of a second photon multiplier is capable of accurately recording beam length distance differences with only one reading.
申请公布号 US5414510(A) 申请公布日期 1995.05.09
申请号 US19940194032 申请日期 1994.02.09
申请人 TEXTRON DEFENSE SYSTEMS, DIVISION OF AVCO CORPORATION 发明人 SCHULTZ, THOMAS J.;KOTIDIS, PETROS A.;WOODROFFE, JAIME A.;ROSTLER, PETER S.
分类号 G01H9/00;G10K15/04;(IPC1-7):G01B9/02 主分类号 G01H9/00
代理机构 代理人
主权项
地址