发明名称 |
Field effect semiconductor device, esp. MESFET |
摘要 |
The field effect semiconductor device has: (a) a first semiconductor layer (22) formed on a semi-insulating semiconductor substrate (21), bearing a control electrode (25) between opposite first and second electrodes (26,27); and (b) a depletion layer-forming system (40) between the control electrode (25) and the first or second electrode (26,27) in order to form, in the system, a depletion layer with an end lying nearer the substrate (21) than does an end of a depletion layer formed in the first semiconductor layer (22) by the control electrode (25). Also claimed are: (i) similar devices in which the depletion layer-forming system is replaced by other arrangements; and (ii) a similar device which omits the depletion layer-forming system and which has heterojunction-forming second and third semiconductor layers, the first and third layers pref. being of GaAs and the second layer pref. being of AlGaAs.
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申请公布号 |
DE19528604(A1) |
申请公布日期 |
1996.09.19 |
申请号 |
DE19951028604 |
申请日期 |
1995.08.03 |
申请人 |
MITSUBISHI DENKI K.K., TOKIO/TOKYO, JP |
发明人 |
KOHNO, YASUTAKA, ITAMI, HYOGO, JP;INOUE, AKIRA, ITAMI, HYOGO, JP |
分类号 |
H01L21/338;H01L29/08;H01L29/10;H01L29/812;(IPC1-7):H01L29/812 |
主分类号 |
H01L21/338 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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