发明名称 Field effect semiconductor device, esp. MESFET
摘要 The field effect semiconductor device has: (a) a first semiconductor layer (22) formed on a semi-insulating semiconductor substrate (21), bearing a control electrode (25) between opposite first and second electrodes (26,27); and (b) a depletion layer-forming system (40) between the control electrode (25) and the first or second electrode (26,27) in order to form, in the system, a depletion layer with an end lying nearer the substrate (21) than does an end of a depletion layer formed in the first semiconductor layer (22) by the control electrode (25). Also claimed are: (i) similar devices in which the depletion layer-forming system is replaced by other arrangements; and (ii) a similar device which omits the depletion layer-forming system and which has heterojunction-forming second and third semiconductor layers, the first and third layers pref. being of GaAs and the second layer pref. being of AlGaAs.
申请公布号 DE19528604(A1) 申请公布日期 1996.09.19
申请号 DE19951028604 申请日期 1995.08.03
申请人 MITSUBISHI DENKI K.K., TOKIO/TOKYO, JP 发明人 KOHNO, YASUTAKA, ITAMI, HYOGO, JP;INOUE, AKIRA, ITAMI, HYOGO, JP
分类号 H01L21/338;H01L29/08;H01L29/10;H01L29/812;(IPC1-7):H01L29/812 主分类号 H01L21/338
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