| 摘要 |
PROBLEM TO BE SOLVED: To shorten the loading time of ICs to be tested by arranging a positioning plate at the upper position of a test tray when the ICs are reloaded to the test tray from a universal tray. SOLUTION: ICs to be tested extracted from a universal tray are directly dropped into the hole 311B of a positioning plate 311 from a suction head. The dropped ICs are regulated at an accurate position by the slant face of the guide section 311C of the positioning plate 311 and are stored in IC carriers 16. When the suction head sucks and conveys eight ICs at a time and stores the ICs in all IC carriers 16 of a test tray TST, a cylinder 315 lifts a frame 312, and the guide section 311C of the positioning plate 311 is separated from the IC carriers 16. The test tray TST loaded with the ICs is discharged by a test tray conveying means. |
