METHOD FOR DETERMINING THE DEFORMATION MODE OF LARGE ARTICLES MADE OF CRYSTALLINE MATERIALS AND PORTABLE X-RAY DIFFRACTOMETER FOR REALISING THEREOF

摘要

1. Method for determining the deformation mode of large articles made of crystalline materials comprising location of a portable X-ray difractometer and an article towards each other, focusing to provide the given distance "focus-article", "article-detector", X-raying it from two sources, registration the distribution radiation intensity and fixing positions of radiation intensity peaks and further determining the deformation mode of said article, characterized in that said article is X-rayed by two radiation sources having different wavelengths and after fixation positions of radiation intensity peaks of the diffracted radiation according to the diffraction on a single set crystallographic planes and according to the relation where θ1 - the diffraction angle of X-ray beam having a given wavelength; θ2 - the diffraction angle of a second X-ray beam having a different given wavelength, λ1 - the given length of the first X-ray beam, λ2 - the given length of the second X-ray beam deformation modes are determined 2. Method according to Claim 1, characterized in that the article can be submitted to X- raying equentially or simultaneously. 3. Portable X-ray difractometer for realizing said method according to clam 1, comprising the base (5), arched guide (4) mounted on said base (5) and a mechanism for inclination relative to said base, an X-ray source (1) and a position-sensitive X-ray detector (3), these elements are mounted on said arched guide (4) with attachments and fixation systems in order to perform a Bregg-Brentano focalisation, characterized in that further comprising at least one additional X-ray beam source (2)with a different given wavelength, focal point of which coincides with the focal point of first X-ray beam (1), and, at least, one X-ray source is provided with a pair of monochromators (12) arranged between the X-ray source and the article, wherein said monochromators (12) are mutually positioned so as to provide for each given wavelength congruence of convergence angle of two monochromatized beams (13) to the value of the angle range of simultaneous registration of said position-sensitive X-ray detector (3). 4. Portable X-ray difractometer according to clam 3, characterized in that the source of X-ray beam (2) with a longer wavelength is mounted on the arched guide between the X-ray beam source with shorter wavelength (1) and said position-sensitive X-ray detector (3). 5. Portable X-ray difractometer according to clam 3, characterized in that said monochromators (12) are provided with mechanisms of their movement in space, each of which comprises an axis of rotation (16), oriented perpendicular to the direction of the main X-ray beam (17), on one end of which a monochrimator (12) is mounted, while the other end is rigidly associated with a slide element (18) mounted enabling to move in a guide (19), made in a housing (20) parallel to the central X-ray beam (17).