发明名称 |
SUBSTRATE TREATING APPARATUS |
摘要 |
PROBLEM TO BE SOLVED: To provide a treating apparatus with which both the upper and under surfaces of a semiconductor wafer can be cleaned simultaneously and the wafer can be dried after cleaning. SOLUTION: The substrate treating apparatus is provided with a first rotation driving means 2, which drives the rotation of a semiconductor wafer 1 by holding its edge by a roller 12 driven for rotation, an upper part treating means 31, which has an upper part cleaning tool 33 for cleaning the upper surface of the semiconductor wafer 1 held by the rotation driving means 2, an under part treating means 32 with which an under part cleaning tool 1 for cleaning the under surface of the semiconductor wafer 1 held by the first rotation holding means is provided replaceably and means 57 and 62 for causing a lower arm 53 for replacing the under part cleaning tool 1 of the under part cleaning means 32 with a holding tool 77 to turn and to move vertically.
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申请公布号 |
JP2002110610(A) |
申请公布日期 |
2002.04.12 |
申请号 |
JP20000292857 |
申请日期 |
2000.09.26 |
申请人 |
SHIBAURA MECHATRONICS CORP;TOSHIBA CORP |
发明人 |
HIRAKAWA TADAO;FURUYA MASAAKI |
分类号 |
B08B3/02;H01L21/304;(IPC1-7):H01L21/304 |
主分类号 |
B08B3/02 |
代理机构 |
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地址 |
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