发明名称 Method and apparatus for in-circuit impedance measurement
摘要 A device and method for measuring an impedance between first and second nodes in an electrical circuit without removing components includes at least one current source to provide first and second currents or current signals of known values. First and second probes contact the respective first and second nodes to apply the first and second currents. A third common probe contacts the circuit at a common node that experiences the same current flow as between the first and second nodes. At least one voltage meter measures voltages corresponding to the first and second currents. A processor calculates the impedance based on the known values of the currents, and the measured values of the voltages.
申请公布号 US6737875(B2) 申请公布日期 2004.05.18
申请号 US20010024587 申请日期 2001.12.17
申请人 DAMERCO, INC. 发明人 DAVIS LARRY J.;COX KENNETH M.
分类号 G01R27/02;G01R27/16;G01R31/27;G01R31/28;(IPC1-7):G01R29/26;G01R31/12;G01R31/02;G01R27/08 主分类号 G01R27/02
代理机构 代理人
主权项
地址