| 发明名称 |
Anisotropic Conductive Film Cutting Calibration System and Method |
| 摘要 |
An anisotropic conductive film (ACF) cutting calibration system and method are disclosed, and the system includes: a cutter, configured to cut the ACF; an image acquisition device, configured to collect a cutting mark image of the ACF according to a predetermined period; a processing device, configured to compare the cutting mark image with a predetermined image, so as to determine an offset of a cutting mark in the cutting mark image with respect to a cutting mark in the predetermined image; and a drawing device, configured to draw the ACF and adjust a speed of drawing the ACF. |
| 申请公布号 |
US2016358323(A1) |
申请公布日期 |
2016.12.08 |
| 申请号 |
US201615163840 |
申请日期 |
2016.05.25 |
| 申请人 |
BOE Technology Group Co., Ltd. ;Hefei Xinsheng Optoelectronics Technology Co., Ltd. |
发明人 |
Niu Honglin;Chen Xutong;Fan Guangfei;Zhang Jinbao;Wang Bin;Zhu Yun |
| 分类号 |
G06T7/00;B29C69/00;G06K9/62;B29C55/00 |
主分类号 |
G06T7/00 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. An anisotropic conductive film cutting calibration system, comprising:
a cutter, configured to cut an anisotropic conductive film; an image acquisition device, configured to acquire a cutting mark image of the anisotropic conductive film according to a predetermined period; a processing device, configured to compare the cutting mark image with a predetermined image, so as to determine an offset of a cutting mark in the cutting mark image with respect to a cutting mark in the predetermined image; and a drawing device, configured to draw the anisotropic conductive film and adjust a speed of drawing the anisotropic conductive film according to the offset. |
| 地址 |
Beijing CN |
