| 摘要 |
The invention concerns a method and a device for calibrating at least one scanning system (4, 5, 17) when producing an object (8) by additive manufacturing, wherein the coordinates of one or several reference positions are measured in the relative coordinate system of each scanning system (4, 5, 17), after which the calibration of each of the scanning systems is adapted starting from the measured coordinates of the reference positions. |
| 主权项 |
1. Method for calibrating a device for manufacturing at least one object (8) by means of an additive manufacturing technique starting from a raw material (2) wherein this raw material (2) is applied in successive layers in a construction zone (9) and each of these successive layers defines one and the same build plane (12) and, after the application of each layer, several energy rays (6,7,15) such as laser beams or electrode rays are moved over this layer so as to form successive cross-sections of said object (8) and to thus build the latter layer by layer,
wherein, in said construction zone (9), several sectors (S1,S2,S3) are determined extending at least in this construction zone (9), whereby every sector (S1,S2,S3) is covered by at least one corresponding energy ray (6,7,15), wherein, for every sector (S1,S2,S3), corresponding scan means (4,5,17) are provided in order to move the point of incidence of the ray in the construction zone (9) over said sector (S1,S2,S3) according to a predetermined pattern so as to form said successive cross-sections, wherein for every sector (S1,S2,S3) a sector coordinate system is associated with the corresponding scan means (4,5,17) of this sector and a relation between this sector coordinate system and a reference coordinate system is determined by an initial transformation function; wherein said point of incidence is moved by means of said scan means (4,5,17) to at least one measuring position (13), which measuring position (13) has sector coordinates which are defined in the sector coordinate system associated with these scan means (4,5,17), and wherein reference coordinates of the point of incidence in this measuring position (13) are determined in said reference coordinate system; wherein for at least one measuring position (13), the deviation is determined between said reference coordinates of the point of incidence and coordinates in said reference coordinate system of said measuring position (13), obtained by applying said initial transformation function on said sector coordinates, wherein on the basis of the thus determined deviation for at least one measuring position (13), and preferably for two, three or more measuring positions (13), a corrected transformation function is calculated, such that the coordinates of said measuring position (13) in said reference-coordinate system are practically equal to the coordinates obtained by applying the corrected transformation function to the sector coordinates of this measuring position (13), characterised in that at least one of said sectors (S1,S2,S3) extends at least partially over two or more of the other sectors (S1,S2,S3). |
