发明名称 METHOD FOR MANUFACTURING GROUP III NITRIDE SEMICONDUCTOR SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To provide a method for delaminating a base substrate and a group III nitride semiconductor layer from each other.SOLUTION: A method for manufacturing a group III nitride semiconductor substrate comprises: an XC layer formation step for forming a TiC layer (XC layer 12) on a sapphire substrate 10, provided that the TiC layer is arranged by alternately and continuously laminating a Ti film (X film 12-1) and a C film 12-2, which are each controlled to have a given thickness, followed by heating; a group III nitride semiconductor layer formation step for forming a group III nitride semiconductor layer 14 on the TiC layer (XC layer 12); and a separation step for separating the sapphire substrate 10 and the group III nitride semiconductor layer 14 from each other.SELECTED DRAWING: Figure 12
申请公布号 JP2016174069(A) 申请公布日期 2016.09.29
申请号 JP20150053058 申请日期 2015.03.17
申请人 FURUKAWA CO LTD 发明人 FUDA SHOICHI;SASAKI HITOSHI
分类号 H01L21/02;C23C14/06;C23C14/34;C23C16/34;C30B29/38;H01L21/20;H01L21/205 主分类号 H01L21/02
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