TEST AND RESTORATION OF EMBEDDED MEMORY

摘要

PROBLEM TO BE SOLVED: To provide an integrated circuit which allows prompt access to the data stored in memory and its test method. SOLUTION: A method and a circuit which combine the memory 12 embedded in an integrated circuit 10 during the memory test mode period with a mutual connection pad 20 are provided. The integrated circuit has A: a processor 14, embedded memory 12, and a switching circuit 26 and this switching circuit combines the memory array and a peripheral circuit of memory coupled to the processor during the ordinary operation mode period of the circuit temporarily to a mutual connection pad of memory during the memory test mode period. B: after the test of memory is finished, the mutual connection pad is cut from the memory array and the peripheral circuit, and this memory array and the peripheral circuit are made to be combined with the processor.