发明名称 COMPREHENSIVE TEST SYSTEM AND INTEGRAL TEST METHOD THEREOF
摘要 PROBLEM TO BE SOLVED: To realize an integral test system and an integral test method thereof, for improving productivity by integrating and automatizing the performance test process in PCBA of a hard disk drive, for example. SOLUTION: A masking board 6 and a printed circuit board assembly are loaded on a pin board where connection pins with different elevations for test process are projected, and the connection pins for the test process, power input connectors and connectors for signal interface are connected with the printed circuit board assembly and pins provided in it. Then ICT signals are output to test the loaded printed circuit board. Only the connection pins for FCT process from among the connection pins for test process are connected and the functions between the printed circuit board assembly and a head disk assembly are tested. Finally, the results of the ICT process and the FCT process are indicated on a display.
申请公布号 JP2000199776(A) 申请公布日期 2000.07.18
申请号 JP19990291040 申请日期 1999.10.13
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 HAN JONG-HYUNG;SHIM YONG-TAEK;KWAK TAE-YOUNG
分类号 G01R31/28;G01R1/073;G01R31/02;H05K3/00;(IPC1-7):G01R31/02 主分类号 G01R31/28
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