发明名称 INFRARED TEMPERATURE MEASURING APPARATUS USING TWO- DIMENSIONAL SCAN
摘要 PROBLEM TO BE SOLVED: To increase the speed of two-dimensional scans made by an infrared temperature measuring apparatus and to reduce the occupancy area. SOLUTION: An infrared element is retained by a shaft, and an X-axis gear 7 is rotatably mounted about the shaft serving as an axis and is periodically rotated back and forth by an X-axis motor 4. A reflector 8 having a Y-axis as its axis of rotation which is perpendicular to the X-axis, a Y-axis gear 11, and a Y-axis motor 9 which causes periodic rotations back and forth are mounted on the X-axis gear 7. High speeds are achieved through weight reduction and the elimination of an external shielding wire, and reduction in the occupancy area is also achieved.
申请公布号 JP2002139382(A) 申请公布日期 2002.05.17
申请号 JP20000335488 申请日期 2000.11.02
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 MATSUSHIMA HARUO
分类号 G01J5/00;F24C7/02;G01J5/08;G01J5/48;H05B6/68;(IPC1-7):G01J5/00 主分类号 G01J5/00
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