发明名称 SONOS FLASH MEMORY DEVICE AND FORMATION METHOD THEREOF
摘要 PURPOSE: An SONOS(Silicon Oxide Nitride Oxide Semiconductor) flash memory device and a formation method thereof are provided to minimize interference between adjacent cells. CONSTITUTION: A semiconductor substrate(200) defined by a plurality of isolation regions(202a) and active regions(204) is prepared. A dielectric film(212) composed of a lower oxide(206), a nitride(208) and an upper oxide(210) is formed on the active regions(204) and is to be cross with a plurality of gate lines(214). A plurality of impurity diffusion regions(216a-216d) are formed in the active regions of both sides of the gate lines. The lower portion of the gate lines(214) is directly connected to the upper part of the isolation regions(202a).
申请公布号 KR20020073960(A) 申请公布日期 2002.09.28
申请号 KR20010013931 申请日期 2001.03.17
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI, JEONG DAL;PARK, JONG U;SHIN, YU CHEOL
分类号 H01L21/8247;H01L21/8246;H01L27/10;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 主分类号 H01L21/8247
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