发明名称 |
METHOD OF FORMING DIELECTRIC FILM USING ALTERNATELY DIELECTRIC FILM DEPOSITION AND HEAT TREATMENT |
摘要 |
PURPOSE: A method of forming a dielectric film is provided to reduce leakage current by obtaining the dielectric film with a desired thickness using alternately a dielectric film deposition and a heat treatment. CONSTITUTION: A first dielectric film is formed on a predetermined layer. A first heat treatment is performed thereon. A second dielectric film is formed on the heat-treated first dielectric film. A second heat treatment is performed thereon. The heat treatments are performed under a predetermined gas atmosphere or under a vacuum condition. The predetermined gas is one selected from a group consisting of O2, O3, N2, Ar, He, O2 plasma, and NH3 plasma.
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申请公布号 |
KR20040102277(A) |
申请公布日期 |
2004.12.04 |
申请号 |
KR20030033651 |
申请日期 |
2003.05.27 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHOI, HAN ME;KIM, GI CHEOL;KIM, YEONG SEON;KWON, THOMAS JONGWAN;LIM, JAE SUN;NAM, GAP JIN |
分类号 |
H01L21/31;(IPC1-7):H01L21/31 |
主分类号 |
H01L21/31 |
代理机构 |
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