发明名称 |
SEMICONDUCTOR DEVICES WITH SUPERLATTICE LAYERS PROVIDING HALO IMPLANT PEAK CONFINEMENT AND RELATED METHODS |
摘要 |
A semiconductor device may include a semiconductor substrate, and a plurality of field effect transistors (FETs) on the semiconductor substrate. Each FET may include a gate, spaced apart source and drain regions on opposite sides of the gate, upper and lower vertically stacked superlattice layers and a bulk semiconductor layer therebetween between the source and drain regions, and a halo implant having a peak concentration vertically confined in the bulk semiconductor layer between the upper and lower superlattices. |
申请公布号 |
US2016336407(A1) |
申请公布日期 |
2016.11.17 |
申请号 |
US201615154296 |
申请日期 |
2016.05.13 |
申请人 |
Atomera, Incorporated |
发明人 |
Mears Robert J.;Takeuchi Hideki |
分类号 |
H01L29/15;H01L29/423;H01L21/8238;H01L27/092 |
主分类号 |
H01L29/15 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device comprising:
a semiconductor substrate; and a plurality of field effect transistors (FETs) on the semiconductor substrate and each comprising
a gate,spaced apart source and drain regions on opposite sides of the gate,upper and lower vertically stacked superlattice layers and a bulk semiconductor layer therebetween between the source and drain regions, anda halo implant having a peak concentration vertically confined in the bulk semiconductor layer between the upper and lower superlattices. |
地址 |
Los Gatos CA US |