发明名称 SEMICONDUCTOR DEVICES WITH SUPERLATTICE LAYERS PROVIDING HALO IMPLANT PEAK CONFINEMENT AND RELATED METHODS
摘要 A semiconductor device may include a semiconductor substrate, and a plurality of field effect transistors (FETs) on the semiconductor substrate. Each FET may include a gate, spaced apart source and drain regions on opposite sides of the gate, upper and lower vertically stacked superlattice layers and a bulk semiconductor layer therebetween between the source and drain regions, and a halo implant having a peak concentration vertically confined in the bulk semiconductor layer between the upper and lower superlattices.
申请公布号 US2016336407(A1) 申请公布日期 2016.11.17
申请号 US201615154296 申请日期 2016.05.13
申请人 Atomera, Incorporated 发明人 Mears Robert J.;Takeuchi Hideki
分类号 H01L29/15;H01L29/423;H01L21/8238;H01L27/092 主分类号 H01L29/15
代理机构 代理人
主权项 1. A semiconductor device comprising: a semiconductor substrate; and a plurality of field effect transistors (FETs) on the semiconductor substrate and each comprising a gate,spaced apart source and drain regions on opposite sides of the gate,upper and lower vertically stacked superlattice layers and a bulk semiconductor layer therebetween between the source and drain regions, anda halo implant having a peak concentration vertically confined in the bulk semiconductor layer between the upper and lower superlattices.
地址 Los Gatos CA US