发明名称 CIRCUIT ARRANGEMENT FOR DETECTING AN EXCESS TEMPERATURE IN SEMICONDUCTOR POWER DEVICES
摘要 <p>The temperature of the power semiconductor component is sensed by a bipolar transistor. The bipolar transistor is in series with a depletion mode MOSFET whose gate and source electrodes are connected together. The drain electrode is also connected to a threshold element. Normally, the FET has low impedance, so that at the input of the threshold element source potential, e.g. ground potential, is present. With current rising as a function of temperature, the current through the FET is limited to a constant, essentially temperature-independent value, and the potential at the input of the threshold element rises steeply. This condition is detected as an overtemperature signal.</p>
申请公布号 EP0240807(B1) 申请公布日期 1990.10.24
申请号 EP19870104113 申请日期 1987.03.20
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 EINZINGER, JOSEF, DIPL.-ING.;FELLINGER, CHRISTINE;LEIPOLD, LUDWIG, DIPL.-ING.;TIHANYI, JENOE, DR.;WEBER, ROLAND, DIPL.-ING.
分类号 H01L29/73;G01K3/00;G01K7/01;H01L21/331;H01L23/58 主分类号 H01L29/73
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