发明名称 ELECTRICAL TEST PROBE
摘要 An electrical test probe is particularly suited to make electrical measurements between electrical contacts on the surface of a substrate. The probe includes a housing and a pair of electrically conductive members pivotally mounted therein. Each conductive member has a fine tip portion and is electrically insulated from the housing and from the other conductive member. In one embodiment a spring is associated with each conductive member for applying a biasing force to that member and permitting the member to rotate about its pivotal mount in opposition to the biasing force thereby maintaining a constant contact force between the tip portion of the member and an electrical contact on the surface of the substrate to be tested. Fine tip portions are positioned in close proximity to one another and each has two beveled faces intersecting at a sloping edge and terminating in a contact point. The contact points are adapted to simultaneously contact the same electrical contact on the surface of the substrate to be tested. In another embodiment the electrically conductive members are removably attached to their mount.
申请公布号 WO9305402(A1) 申请公布日期 1993.03.18
申请号 WO1992US00880 申请日期 1992.02.03
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 FAURE, LOUIS, HENRY;HODGE, PHILO, BURTON;MCSHEEHY, JOHN, LANCASTER;RAFTER, PATRICK, JOHN;SIMMONS, ROSWELL, HARRISON
分类号 G01R1/067 主分类号 G01R1/067
代理机构 代理人
主权项
地址