发明名称 Method and device for calibrating an angle of a scanning device for lines.
摘要 <p>The angle adjustment system uses a test body (16) with at least one test surface (14',14",14"') carrying a marking line (17,17',17") corresponding to the scanning line (15) with a marking (18, 18', 18") at a given point along its length. The scanner housing (11) is pivoted about one or two axes (x,y) to bring a marked point (20) along the scanning line into alignment with the test surface marking before pivoting the housing about a further axis (z) to bring the scanning line into alignment with the marking line. Pref. the marked point lies at the centre of the scanning line, the first two axes perpendicular to the scanning beam (12") being directed onto the marked point.</p>
申请公布号 EP0623835(A1) 申请公布日期 1994.11.09
申请号 EP19940104808 申请日期 1994.03.25
申请人 ERWIN SICK GMBH OPTIK-ELEKTRONIK 发明人 HIPPENMEYER, HEINRICH;KILIAN, REINHOLD
分类号 G06K7/10;(IPC1-7):G02B27/00;G01N21/89 主分类号 G06K7/10
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