| 摘要 |
PROBLEM TO BE SOLVED: To provide a method for preparing a transformation table for transforming fail bit map data in the test process of a semiconductor memory into physical coordinates using design data. SOLUTION: The method for forming a conversion table comprises a step (S107) for defining an placement pattern of memory cells being repeated a plurality of times as a basic pattern, a step (S107) for associating the local physical address of the memory cell with physical coordinates, a step (S109) for grouping the memory cells based on a basic pattern, and a step (S111) for associating the physical address at the origin of a basic pattern referring to the origin of all memory cells with physical coordinates.
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