发明名称 Scale and position measuring system for absolute position determination
摘要 A scale which is suitable for an absolute position determination, the scale includes a track which extends in at least one measuring direction and in which graduation areas of identical width and different optical properties are alternatingly arranged. At least first, second and third graduation areas with different optical properties that are arranged in the track, wherein a first logical signal is unequivocally assigned to a first combination of two successive different graduation areas, and a second logical signal is unequivocally assigned to a second combination of two successive different graduation areas, and wherein the first and second combinations differ from each other.
申请公布号 US2003145479(A1) 申请公布日期 2003.08.07
申请号 US20030345841 申请日期 2003.01.16
申请人 MAYER ELMAR;BENNER ULRICH 发明人 MAYER ELMAR;BENNER ULRICH
分类号 G01D5/249;G01D5/347;G01D5/36;H03M1/06;H03M1/28;H03M5/12;(IPC1-7):B26D7/28 主分类号 G01D5/249
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